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Pulsed laser-induced effects in the material properties of tungsten thin films
Roger Evans
SANTIAGO CAMACHO LOPEZ
Marco Antonio Camacho López
Claudia Isabel Sánchez Pérez
ALFREDO ERASTO ESPARZA GARCIA
Acceso Abierto
Atribución-NoComercial-SinDerivadas
http://dx.doi.org/10.1088/1742-6596/59/1/093
Surface Oxidation
"In this work we present evidence of photo-induced effects on crystalline Tungsten (W) films. A frequency doubled Nd:YAG (5ns) laser was used in our experiments. The W thin films were deposited on silicon substrates by the DC-sputtering technique using W (Lesker, 99.95% purity) targets in an argon atmosphere. The crystalline phase of the deposited W films was determined by X-ray diffraction. Our experimental results show clear evidence that several events take place as a consequence of exposure of the W films to the laser nanosecond pulses. One of those events has a chemical effect that results in a significant degree of oxidation of the film; a second event affects the structural nature of the initial W material, resulting into a material phase change; and a third event changes the initially homogeneous morphology of the film into an unexpected porous material film. As it has been confirmed by the experiments, all of these effects are laser fluence dependent. A full post exposure analysis of the W thin films included Energy Dispersive Spectrometry to determine the degree of oxidation of the W film; a micro-Raman system was used to explore and to study the transition of the crystalline W to the amorphous-crystalline WO<sub>3</sub> phase; further analysis with Scanning Electron Microscopy showed a definite laser-induced porosity which changes the initial homogeneous film into a highly porous film with small features in the range from 100 to 300 nm."
Gary Williams Institute of Physics, UK
2007
Artículo
Journal of Physics: Conference Series, Vol. 59, Págs. 436-439
Inglés
Evans,R.,Camacho López,S.,Camacho López,M.A.,Sánchez Pérez,C.,Esparza García,A.2007.Pulsed Laser-Induced Effects in the Material Properties of Tungsten Thin Films.Journal of Physics: Conference Series,59,436-439.doi:0.1088/1742-6596/59/1/093
ÓPTICA
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